Mathematical model of computer equipment reliability
Abstract
The article is devoted to the construction of a mathematical model of reliability of computer equipment devices. The mathematical model is constructed by using the probability diffusion equation, which corresponds to a stochastic process and is a two-parameter function, whose parameter estimates have fairly simple analytical expressions that meet the requirements of international practice. Computer technology is widely used as various devices (personal computers, computers, laptops, mainframes, clusters, servers, workstations). Their main purpose is to provide the user with stable access to information stored on their media and the possibility of continuous processing of this information, which makes it necessary to constantly maintain such systems in a working state. Thus, computer equipment refers to systems that require a high degree (level) of reliability. Given that the level of reliability of any equipment during its operation is constantly decreasing, which is due to the processes of aging and wear, the determination and prediction of reliability is an urgent scientific and technical task. One of the most common methods for determining and predicting the state of an object at any given time are probabilistic-physical methods, which are based on the use of probabilistic models for processing statistical information obtained during operation, or testing real physical objects. Regardless of the type of computer equipment, it includes electronic, electrical and electromechanical elements that preserve their functional properties for the entire period of use. According to modern views on the operation of electronic, electrical and electromechanical elements, a complex factor that characterizes the technical condition of the element is the qualitative passage of an electrical signal through contact connections, which is determined by the value of the contact resistance. The obtained mathematical model of the distribution density is a two-parameter function, the parameters of which have a physical interpretation in the form of the rate of change of contact resistance and the root mean square deviation of the velocity
Keywords
probabilistic-physical method; two-parameter function; defining parameter; contact resistance; Fokker-Planck-Kolmogorov equation
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