Author

Oleksandr Brunov

Cherkasy Scientific Research Forensic Centre of the Ministry of Internal Affairs of Ukraine

18009, 104 Pasterivska Str., Cherkasy, Ukraine

https://orcid.org/0000-0002-4605-814X

All articles

open access

Keywords: multiprobe atomic-force microscopy; mechatronic device; functional surface; surface topology; thin coating

Investigation of functional surfaces of mechatronic devices by multiprobe atomic force microscopy

Igor Kobyts, Oleksandr Brunov, Olga Andriienko, Svitlana Bilokin, Serhii Rotte, Maksym Bondarenko

https://doi.org/10.24025/2306-4412.3.2021.246972

Suggested citation

Kobyts, I., Brunov, O., Andriienko, O., Bilokin, S., Rotte, S., & Bondarenko, M. (2021). Investigation of functional surfaces of mechatronic devices by multiprobe atomic force microscopy . Bulletin of Cherkasy State Technological University, 26(3), 24-35. https://doi.org/10.24025/2306-4412.3.2021.246972
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  • 18.10.2021
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  • Library Science. Record Studies. Informology - Volume 26, No. 3, 2021